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		Source: 2021 IEEE East-West Design & Test Symposium (EWDTS), Batumi, Georgia, September 10-13, 2021 : proceedings. [S. l.], 2021. P. 252-255
	    
	
                  
            Type: статьи в сборниках
          
        
                  
            Date: 2021
          
        
                                      
            Description:
                        It is known that if we have set of test pairs of neighbor Boolean vectors for robust testable PDF for each path considered in the given circuit, we may derive test sequence for these faults consisting
                          
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		Source: Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2018), Kazan, Russia, September 14-17, 2018. [S. l.], 2018. P. 645-648
	    
	
                  
            Type: статьи в сборниках
          
        
                  
            Date: 2018
          
        
        
 
 
    
                        
		    
		Source: Russian physics journal. 2018. Vol. 60, № 10. P. 1837-1844
	    
	
                  
            Type: статьи в журналах
          
        
                  
            Date: 2018
          
        
                                      
            Description:
                        Method of finding false paths in sequential circuits is developed. In contrast with heuristic approaches currently used abroad, the precise method based on applying operations on Reduced Ordered Binar
                          
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